AJP: Endo -- Index by Author (1 September 1998, 275, Number 3)

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Index by Author: 1 September 1998; 275 (3) [Table of Contents]

| A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z |

A: Ackermans, Mariëtte T. [Abstract] [Full Text]; Alm, Richard A. [Abstract] [Full Text]; Arditi, Moshe [Abstract] [Full Text]; Aslesen, Rune [Abstract] [Full Text]; Astrup, Arne [Abstract] [Full Text]; Audoly, Laurent P. [Abstract] [Full Text]
B: Baracos, V. [Abstract] [Full Text]; Berr, Stuart S. [Abstract] [Full Text]; Bonen, A. [Abstract] [Full Text]; Booth, Frank W. [Abstract] [Full Text]; Boschmann, M. [Abstract] [Full Text]; Brolin, R. E. [Abstract] [Full Text]
C: Castle, Arthur L. [Abstract] [Full Text]; Chadan, S. G. [Abstract] [Full Text]; Clanachan, Alexander S. [Abstract] [Full Text]; Clark, Pamela A. [Abstract] [Full Text]; Coughlin, Sean [Abstract] [Full Text]; Criswell, David S. [Abstract] [Full Text]
D: DeMayo, Franco [Abstract] [Full Text]; Dyck, D. J. [Abstract] [Full Text]
E: Ejiofor, Joseph [Abstract] [Full Text]; Endert, Erik [Abstract] [Full Text]; Evans, William J. [Abstract] [Full Text]
F: Fineman, Mark S. [Abstract] [Full Text]; Fiorotto, Marta L. [Abstract] [Full Text]; Flier, Jeffrey S. [Abstract] [Full Text]; Fried, S. K. [Abstract] [Full Text]
G: Glatz, J. F. C. [Abstract] [Full Text]; Gordon, Scott E. [Abstract] [Full Text]; Gould, Gwyn W. [Abstract] [Full Text]; Gruca, Lourdes L. [Abstract] [Full Text]
H: Han, Dong-Ho [Abstract] [Full Text]; Hatsuta, Minoru [Abstract] [Full Text]; Hellmér, J. [Abstract] [Full Text]; Henningsson, Ragnar [Abstract] [Full Text]; Hernandez, Jazmir M. [Abstract] [Full Text]
I: Ivy, John L. [Abstract] [Full Text]
J: James, David E. [Abstract] [Full Text]; Jensen, Jørgen [Abstract] [Full Text]
K: Kalhan, Satish C. [Abstract] [Full Text]; Kalra, Vijay K. [Abstract] [Full Text]; Katz, Joseph [Abstract] [Full Text]; Kiens, B. [Abstract] [Full Text]; Kim, Kwang Sik [Abstract] [Full Text]; Kirwan, John P. [Abstract] [Full Text]; Koehler-Stec, E. M. [Abstract] [Full Text]; Kogo, Hiroshi [Abstract] [Full Text]; Kohrt, Wendy M. [Abstract] [Full Text]; Krishnan, Raj K. [Abstract] [Full Text]; Kristiansen, S. [Abstract] [Full Text]; Kuo, Chia-Hua [Abstract] [Full Text]
L: Landschulz, K. T. [Abstract] [Full Text]; Landschulz, W. H. [Abstract] [Full Text]; Landt, Michael [Abstract] [Full Text]; Leahy, Jack L. [Abstract] [Full Text]; Li, Hua [Abstract] [Full Text]; Lin, Baozhen [Abstract] [Full Text]; Liu, Que [Abstract] [Full Text]; Liu, S. [Abstract] [Full Text]; Lopaschuk, Gary D. [Abstract] [Full Text]; Luiken, J. J. F. P. [Abstract] [Full Text]; Lundquist, Ingmar [Abstract] [Full Text]
M: Mai, Vu [Abstract] [Full Text]; Mantzoros, Christos S. [Abstract] [Full Text]; Marsh, Brad J. [Abstract] [Full Text]; Martin, Daniel R. [Abstract] [Full Text]; Martin, Laura B. [Abstract] [Full Text]; Martin, Sally [Abstract] [Full Text]; Matheny, Michael [Abstract] [Full Text]; McGuinness, Owen P. [Abstract] [Full Text]; Melvin, Derek R. [Abstract] [Full Text]; Miller, Steven B. [Abstract] [Full Text]; Moeniralam, Hazra S. [Abstract] [Full Text]; Monroe, M. B. [Abstract] [Full Text]; Mygind, Elsebeth [Abstract] [Full Text]
N
O: O'Gorman, Donal J. [Abstract] [Full Text]
P: Parkhouse, W. S. [Abstract] [Full Text]; Patterson, Bruce W. [Abstract] [Full Text]; Petersen, R. N. [Abstract] [Full Text]; Pilch, Paul F. [Abstract] [Full Text]; Prasad, A. [Abstract] [Full Text]
Q
R: Raben, Anne [Abstract] [Full Text]; Rao, S. P. [Abstract] [Full Text]; Ravussin, E. [Abstract] [Full Text]; Ricci, M. R. [Abstract] [Full Text]; Roemmich, James N. [Abstract] [Full Text]; Rogol, Alan D. [Abstract] [Full Text]; Romijn, Johannes A. [Abstract] [Full Text]; Rossi, Karen Q. [Abstract] [Full Text]; Russell, C. D. [Abstract] [Full Text]
S: Sauerwein, Hans P. [Abstract] [Full Text]; Savin, Samuel M. [Abstract] [Full Text]; Scarpace, Philip J. [Abstract] [Full Text]; Schrom, Nancy [Abstract] [Full Text]; Schwartz, Robert J. [Abstract] [Full Text]; Shen, Yamin [Abstract] [Full Text]; Simpson, I. A. [Abstract] [Full Text]; Snitker, S. [Abstract] [Full Text]; Sultana, Chand [Abstract] [Full Text]; Super, Dennis M. [Abstract] [Full Text]
T: Tamura, Kazuhiro [Abstract] [Full Text]; Taya, Kazuyoshi [Abstract] [Full Text]; Tayek, John A. [Abstract] [Full Text]; Tümer, Nihal [Abstract] [Full Text]; Turcotte, L. P. [Abstract] [Full Text]
U
V: Van Der Vusse, G. J. [Abstract] [Full Text]; Van Lanschot, J. Jan B. [Abstract] [Full Text]; Vannucci, S. J. [Abstract] [Full Text]
W: Watanabe, Gen [Abstract] [Full Text]; Weltman, Arthur [Abstract] [Full Text]; Williamson, David L. [Abstract] [Full Text]; Willis, P. E. [Abstract] [Full Text]
X
Y
Z: Zeng, Jianbo [Abstract] [Full Text]; Zhang, Y. [Abstract] [Full Text]